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Now A System For High-speed Inspection Of Micro-leds On Wafers To Detect Abnormalities In Their External Appearance, Intensity And Wavelength Of Their Light Emi

Mar. 15, 2021

Now a system for high-speed inspection of micro-LEDs on wafers to detect abnormalities in their external appearance, intensity and wavelength of their light emissions. This inspection system utilizes a photoluminescence (PL) measurement technique* that is based on our advanced image processing technology and a newly developed imaging module with our unique optical design technology. We call this micro-LED PL inspection system the ‘MiNYTM PL’, type number C15740-01.

The MiNYTM PL makes fast pass/fail decisions when inspecting micro-LEDs, which will contribute to an increased product yield for use in display applications and will also help to increase the R&D efficiency of micro-LEDs. Furthermore, the MiNYTM PL will also streamline the 100 percent inspection process of micro-LEDs in future mass production lines. Sales of the MiNYTM PL will start Monday March 8, 2021 to LED and display manufacturers in domestic and overseas markets.

*PL measurement technique is a versatile method for evaluating characteristics of LED and other devices by capturing and analyzing light-excited photoluminescence images in a non-contact and non-invasive manner.


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